V5- GEN - Product Story 1

New test system provides simple and precise nanomechanical testing

Materials perform differently at the micro/nano scales than they perform at the macroscale. This “scale effect” has created a serious challenge for developers of microelectromechanical systems (MEMS) and nanomaterials, because no specialized tools have been available for obtaining reliable data and observing deformation in real-time at such a small scale.

To fulfill this market need, MTS partnered with Touchstone Research Laboratory to develop the MTS InSEM™ T250 testing system. This system combines real-time scanning electron microscope (SEM) imaging with in-situ materials tensile testing, extending simplicity and precision to small-scale materials characterization without sacrificing flexibility or control.

Capable of applying loads from 10 gm to 25 lbs. and powered by industry-leading MTS TestWorks® 4 software, the InSEM T250 delivers unmatched levels of experimental control, giving you the freedom to perform real-time testing on any recorded or calculated data channel.

The MTS InSEM T250 won a prestigious R&D Magazine R&D 100 Award in November 2006, which recognizes outstanding achievements in new product development.

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MTS Systems

14000 Technology Drive
Eden Prairie, MN USA
55344  

Tel: 952.937.4000
Tel: 800.328.2255
Fax: 952.937.4515
Email: info@mts.com